Machine Learning and Machine Vision Systems for Microelectronic Screening
Join the CALCE/SMTA Counterfeit Parts and Materials Symposium for a talk on Machine Learning and Machine Vision Systems for Microelectronic Screening By: Naresh Menon Covisus Inc. Abstract: With support from the Defense Microelectronics Activity (DMEA), we are developing DTEK 3.0 to support the ongoing Department of Defense (DOD) challenge to ensure the authenticity and security of […]
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